咨询热线

18948178581

当前位置:首页  >  产品展示  >  其他电子测试测量设备  >  测试系统  >  advantest TAS7000 成像系统

advantest TAS7000 成像系统

简要描述:advantest TAS7000 成像系统 3D Imaging Analysis Systemimg_tas7000_0001TAS7000 3D Imaging Analysis SystemThe TAS7000(?1) 3D(?2) imaging analysis system exploits the unique properties of terahertz waves(?3).

  • 产品型号:爱德万TAS7000
  • 厂商性质:经销商
  • 更新时间:2024-04-19
  • 访  问  量:786

详细介绍

品牌ADCMT/爱德万产地类别进口
应用领域综合

advantest TAS7000 成像系统


3D Imaging Analysis Systemimg_tas7000_0001TAS7000 3D Imaging Analysis SystemThe TAS7000(?1) 3D(?2) imaging analysis system exploits the unique properties of terahertz waves(?3).The TAS7000 enables 3D non-destructive analysis of the internal structure and chemical composition of the target ; the results are shown on a 3D display. In addition, this system enables measurement of spectral characteristics and 2D(?4) mapping.Advantest has developed an unprecedented solution for 3D analysis of industrial materials such as plastics and ceramics, as well as pharmaceutical products.?1: TAS7000 = This system was developed by Advantest in collaboration with Prof. Dr. Kodo Kawase of Nagoya University.?2: 3D = Three-dimensional?3: Terahertz waves = Region of electromagnetic spectrum between hundred gigahertz to tens of terahertz.?4: 2D = Two-dimensional


A global first: non-destructive 2D and 3D analysis utilizing Terahertz waveThe TAS7000 enables non-destructive, 2D and 3D analysis of the internal composition and structure of measurement targets, utilizing computed tomography (CT) and exploiting the unique properties of terahertz waves.The TAS7000 enables not only analysis of the structural homogeneity of an internal substance, but also identification of constituents and quantitative distribution measurement.Moreover, in contrast with other regions of the electromagnetic spectrum, terahertz waves can penetrate various types of materials with moderate transmittance, allowing for analysis.High-speed measurement utilizes Advantest's terahertz optical sampling technologyThe TAS7000 relies on Advantest's newly developed, ultra-short pulse femtosecond optical fiber laser technology for terahertz wave generation and detection, and utilizes the company's original terahertz wave high-speed optical sampling technique. Thus, it delivers measurement throughput approximay 1000 times greater than the previous system.Broadband terahertz wave spectroscopic analysis up to 3THzThe TAS7000 enables broadband, high-resolution spectroscopic analysis up to a maximum analytical frequency of 3THz. The system is ideally suited for acquiring fingerprint spectra of a comprehensive range of chemical, industrial, and biological materials. For high precision, the system has the option to remove water vapor from the sample chamber by flowing dry air during the measurement.


SpecificationsApplications Non-destructive analysis, 3D constituent density distribution analysis, 3D spectroscopic measurementAnalytical functions 2D / 3D computed tomography (CT) density distribution analysisTerahertz spectroscopic transmission analysis:2D / 3D CT spectroscopic measurement mode2D spectroscopic measurement mode (mapping measurement)Spectroscopic measurement modeAnalytical frequency range (?1) High dynamic range module : 0.02THz to 0.6THz Broadband module (?2) : 0.05THz to 3THzDynamic range (?1) High dynamic range module : ≥60dB (at peak, 3min.)Broadband module : ≥50dB (at peak, 15min.)Spatial resolution of CT measurement function (?1) ≤3mm (using wire phantom; modulation transfer function (MTF), 10%)Throughput Maximum waveform acquisition speed : 250Hz?(Spectroscopic measurement mode)Acquisition time for CT cross section : ≤15min.?(Measurement of 1 CT cross section is divided into 64×64)Maximum sample size and weight ≤φ310mm (12.2inch) × 310mm (12.2inch) (H)≤20kgOperating environment Temperature : +10°C to +30°C Relative humidity : ≤80% (non-condensing)Power requirements AC100V (100-120) / 200V (220-240), 850VA, 50/60HzDimensions Size : 1500mm (W) × 1570mm (D) × 1600mm (H)Mass : 400kg or less (?3)?1: At temperatures of 23°C ±5°C.?2: With dry air option.?3: Including analysis unit and CT test bench carrier, excluding hardware options and PC.


Applications: Ceramic Filter AnalysisNon-Destructive Analysis of Ceramic Filters for Reduction of Diesel Engine EmissionsNovel method for non-destructive analysis of ceramic filtersThe DPF(?1) is a key component of the after-treatment system that reduces emissions from diesel engine exhaust gas. Analyzing accumulated PM(?2) such as soot and ash in a DPF is critical for optimizing the after-treatment system.The TAS7000 enables non-destructive analysis of the 3D-PM(?3) distribution in a DPF, as well as soot and ash analyses.img_tas7000_0004_en?1: DPF = Diesel Particulate Filter?2: PM = Particulate Matter?3: 3D = Three-dimensionalimg_tas7000_0003DPF Analysis with the TAS7000img_tas7000_0006_enMeasurement principleimg_tas7000_0007Sample DPFWhen a DPF sample is placed on the CT test bench, it is scanned with broadband terahertz radiation. By analyzing the spectral characteristics of the radiation transmitted through the sample, the system can display a data-rich graphics of the internal structure and quantitative distribution (g/L) of PM within the sample.img_tas7000_0005_enimg_tas7000_0008_en3D-PM quantitative distribution analysisof sampleimg_tas7000_0009_en2D-PM quantitative distribution analysis of sampleAdvantages of the TAS7000 for DPF AnalysisOptimizing product quality using 3D quantitative distribution analysisThe TAS7000 enables PM quantitative distribution (g/L) analysis in arbitrary areas within DPF samples, allowing developers to obtain data to visualize the thickness of soot and ash layers in detail, and to assess any changes in the internal structure of the filter. This data can facilitate the design of optimal after-treatment systems.Improving R&D efficiencyBy making it possible for the first time to analyze filter samples without physically dissecting them, development time can be sharply reduced. Additionally, repeated analyses of the same sample are possible, allowing for confirmation of results and monitoring changes in follow-up investigations.Ease of operationNo complicated setup is necessary. Samples are simply placed on the CT test bench.

advantest TAS7000 成像系统


Agilent 83497A 光电时钟恢复模块


Agilent 8157A 光衰减仪


Agilent 81637B 快速功率计


Agilent 34570A 数字万用表


Agilent 44476A 微波复用器模块


Agilent 70004A 光谱分析仪


Agilent 81000FI 光纤连接器


Agilent 81002FF 积分球


Agilent 81521B 光功率计探头


Agilent 81524A 光功率探头


Agilent 81525A 大功率光学探头


Agilent 81533A 接口模块


Agilent 81533B 接口模块


Agilent 81536A 光功率计传感插件


Agilent 81560A 可变光衰减器


Agilent 81567A 可变光衰减器模块


Agilent 8156A 光衰减器


Agilent 81578A可变光衰减器模块


Agilent 81610A回损测试模块


Agilent 81619A 光功率模块


Agilent 81624A 光学探头


Agilent 81625A 光功率探头


Agilent 81633A 分布式反馈(DFB)激光器


Agilent 81635A 双光功率传感器


Agilent 8163A光功率计主机


Agilent 8163B 光功率计


Agilent 8164A 光波测量系统主机


Agilent 81650A 单法布里-珀罗激光源


Agilent 81651A 光源模块


Agilent 81654A 法布里-珀罗激光源


Agilent 81662A 分布式反馈(DFB)激光器


Agilent 8168E 可调谐激光源


Agilent 83440D光波转换器


Agilent 83480A 数字通信分析仪


Agilent 83483A 双通道电模块


Agilent 83486A 光电模块


Agilent 83487A 光电模块


Agilent 83492A 多模时钟模块


Agilent 83493A 单模时钟恢复模块


Agilent 83494A 单模时钟恢复模块


Agilent 83495A 时钟恢复模块


Agilent 83496A 光电时钟恢复模块


Agilent 86100A 光示波器


Agilent 86100C 宽带示波器主机


Agilent 86103A 光电模块


Agilent 86103B 光电模块


Agilent 86105A 光电模块


Agilent 86105B 光电模块


Agilent 86106B 光电模块


Agilent 86107A 精密时基参考模块


Agilent 86120B 多波长计


Agilent 86120C 多波长计


Agilent 86142B 高性能光谱分析仪


Agilent 86146b 光谱分析仪


Agilent N7740 多端口光功率计


Ando AQ2140光功率计


Ando AQ2730光功率计模块


Ando AQ2742 光功率传感器


Ando AQ2743 光功率传感器


Ando AQ4211LD组件


Ando AQ4215 光功率计


Andu AQ-4137 光源


Andu AQ-4142 光源


Anritsu 69347B 信号源


Anritsu MN9610B光衰减器


Anritsu ms9710c 光谱分析仪


Anritsu MS9740A 台式光谱分析仪


CVI Melles Griot 05-LHP-211-1 激光器


Ericsson FSU-975 光纤熔接机


Exfo IQS-3150 可变衰减器


EXFO WA-1650 光波长计


HP 8153A 光功率计


HP 8153B 光波万用表


HP 81551MM 点光源模块


HP 83540A 插件信号源


HP 8595E 频谱分析仪


IFR GPS-101定位系统模拟器


Jdsu HA9 光衰减器


JDSU OLP-55 光功率计


Keithley 7001半导体开关系统


Keithley 2001A 数字多用表


Keithley 2400 数字源表


Keithley 2400-C 数字源表


Keithley 2500 数字源表


Keithley 2502 数字源表


KEITHLEY 6221 电流源表


Keysight 11708A 衰减器垫


Keysight 3458A 数字多用表


Keysight 34903A GP开关模块


Keysight 81570A 可变光衰减器模块


Keysight 81618A 接口模块


Keysight 81623B 锗光功率探头


Keysight 81630B 大功率光传感器


Keysight 81634B 低偏振相关光功率传感器


Keysight 81636B 光功率传感器


Keysight 8164B 光波测量系统主机


Keysight 82357B GPIB 卡


Keysight 86100D 宽带宽示波器主机


Keysight 86105C 光电采样模块


Keysight 86105D 光电模块


Keysight E3631A 三路输出电源


Keysight J7231B 抖动通信性能分析仪


Keysight N5181A 射频模拟信号发生器


Keysight N5980A 比特误码率测试仪


Keysight N7744A 多端口光功率计


Keysight N7748A 高性能光功率计


Newport 818-IG高性能光电二极管传感器


Newport 918-IG 高性能光电二极管传感器


Newport 918-ir 高性能光电二极管传感器


NI PCI GPIB小卡


NI PXI-1031 板卡


Photom EP-712 光功率计


Picometrix PT-12B 光电转换芯片


R&S FSP3 频谱分析仪


R&S NRPZ51 射频功率计



产品咨询

留言框

  • 产品:

  • 您的单位:

  • 您的姓名:

  • 联系电话:

  • 常用邮箱:

  • 省份:

  • 详细地址:

  • 补充说明:

  • 验证码:

    请输入计算结果(填写阿拉伯数字),如:三加四=7